December 9, 2020 | Online
シリコン上の薄膜光検出器(TFPD)を用いた高解像度・低コストIRイメージングに向けて
9 AM CET/5 PM JST
2020年12月9日:日本時間の17時・9時C E T
Why is there a high-quality camera in everyone’s smartphone while infrared imagers are still limited to specialty applications?
The answer is the high-throughput, wafer-level fabrication process that’s available for image sensors in the visible range ... but not yet for SWIR imagers.
New breakthroughs by imec will change that picture. And this webinar is your chance to discover them.
なぜ誰のスマホにも高品質なカメラが搭載されているのに、赤外線イメージャーはまだ専門的な用途に限定されているのでしょうか?
その答えは、ハイスループット、ウエハレベルの製造プロセスが可視領域のイメージセンサには利用可能ですが、SWIRにはまだないからです。
Imecの新しいブレークスルーは、このような状況を変えるでしょう。そして、このウェビナーはそれらを発見するチャンスです。
Join this webinar on Wednesday December 9, 2020, at 9 AM CET/5 PM JST to find out how:
2020年12月9日(水)の17時(日本時間)・(午前9時CET)に開催されるウェビナーにご招待いたします。ウェビナーの内容は下記の通りです:
Dr. Pawel E. Malinowski was born in Lodz, Poland, in 1982. He received his M.Sc.Eng. degree in electronics and telecommunications (thesis on design of radiation-tolerant integrated circuits) from the Lodz University of Technology, Poland, in 2006. In 2011, he received a Ph.D. degree in electrical engineering from the KU Leuven, Belgium (thesis on III-nitride-based imagers for space applications).
Pawel is working at imec since 2005, and in the Large Area Electronics Department since 2011 (currently Sensor & Actuator Technologies). He is Program Manager “Pixel Innovations” and he focuses on disruptive optical sensor technologies, including new types of image sensors enabled by thin-film semiconductor integration. Pawel overlooks the innovation actions, works closely with tech teams, sets the technology roadmaps and prepares go-to-market scenarios.
Pawel has coauthored more than 40 publications and submitted 5 patent applications. He was a recipient of the International Display Workshops Best Paper Award in 2014 and the SID Display Week Distinguished Paper Award in 2018. He co-supervised the work leading to the I-Zone Best Prototype Award at SID2019. Pawel is Member of IEEE and SID, and served on the ODI Committee (Optoelectronics, Displays, and Imagers) of the 64th and 65th IEDM conference.