SWTest 2025
June 02 - 04, 2025 | Carlsbad, USA
The Semiconductor Wafer Test Conference (SWTest) is celebrating over 30 years as the only industry event that focuses on all the aspects associated with microelectronic wafer and die level testing.
imec
Geert Gouwy, R&D Engineer at imec, will chair a Technical Session on Monday June 2 from 1h30 to 3 PM. The talks within this session include "Ultra-low leakage probe card for wafer parametric testing enabled by µ3D printing", "Optimizing Probe Card Performance for Small Pad Sizes in Parametric Testing – Maintaining Probe Pin Geometry for Extended Probe Card Lifetime and Lower Cost of Test", "MEMS probe card solution to address parametric test challenges" and a Poster Session.
About
The Semiconductor Wafer Test Conference (SWTest) is celebrating over 30 years as the only industry event that focuses on all the aspects associated with microelectronic wafer and die level testing. The conference has the perfect mixture of manufacturer and vendor presentations. It is a probe technology forum where attendees come to learn about recent developments in the industry and exchange ideas. There is a relaxed atmosphere with a golf tournament, an EXPO, social activities and plenty of time for informal discussion and networking.
It is a two-and-a-half-day conference that starts with a Monday Keynote Speaker and consists of a Technical Program with technical presentations organized in 8 theme-oriented sessions. There will also be poster presentations during the coffee breaks.
The SWTest EXPO is the Who’s Who of Industry Leaders in the Semiconductor Wafer Test Industry. The top probe card, probe equipment and related service suppliers will showcase the latest products and services at SWTest 2025.