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/ ISTFA 2024

ISTFA 2024

28 October - 01 November 2024 | San Diego, US

50th International Symposiums for Testing and Failure Analysis (ISTFA)

imec

Failure Analysis in a Nanoelectronics Research Center: Challenges and Opportunities- Ingrid De Wolf on Wednesday 30th - 1:40 – 2:00 p.m.

About

The pinnacle event for the microelectronics failure analysis community. Come and share your insights, experiences, and expertise, contributing to the advancement of our industry and the progression of your career. Submit your work for publication and present it to a diverse and knowledgeable audience in San Diego, California, marking half a century of excellence at the International Symposium for Testing and Failure Analysis. Let’s make this milestone unforgettable together!

This year’s theme is Artificial Intelligence (AI). Artificial Intelligence (AI) is revolutionarily changing the world and profoundly reshaping the semiconductor industry. AI has been integrated into design, manufacture, process optimization, quality, reliability, and failure analysis (FA). Embracing and effectively using AI in Fault isolation (FI) and FA becomes crucial for new technology development and high-volume mass production in the semiconductor industry. Although numerous AI applications in FI and FA have been demonstrated, there are still many unaddressed challenges, unestablished standards, and unexplored applications to be resolved. On the other hand, giant and highly integrated high-performance computing devices designed for AI algorithm training lead to tremendous challenges to FI and FA.

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