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/International Conference on Microelectronic Test Structures 2025

International Conference on Microelectronic Test Structures 2025

March 24 - 27, 2025 | Texas, US

The IEEE International Conference on Microelectronic Test Structures (ICMTS) is the premier conference devoted to the development, measurement and analysis of test structures providing a forum for designers and users of test structures to discuss recent developments and future directions. The meeting is an IEEE technically sponsored conference, sponsored by the IEEE Electron Devices Society, and known in the industry as one of the most reputable conferences on semiconductor testing research.

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Presentation on 'Smart Diagnostics for 3D CFET: A Machine Learning Approach to Failure Analysis' - by Jerome Mitard, R&D Manager, 27th of March at 09:40, San Antonio, Texas.

Presentation on 'Active Sampling of Electrical Characterization Parameters for Efficient Measurement', by Hüsnü Murat Koçak - doctoral researcher, 27th of March at 09:40, San Antonio, Texas.

Presentation on 'Non-uniformities in MOSFET-array characteristics caused by probe-induced mechanical stress', by Pablo Sarazá Canflanca, R&D Engineer, 26th March 2025 a 9:40, San Antonio, Texas, US.

Presentation on 'Microheater integration in gate dielectric functionalized IGZO thin film transistors for methanol sensing', by Maider Calderon Gonzalez, PhD researcher, 27th March, 11:10 local time,  at The Historic Menger Hotel in San Antonio, TX, USA.

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The IEEE International Conference on Microelectronic Test Structures (ICMTS) is the premier conference devoted to the development, measurement and analysis of test structures providing a forum for designers and users of test structures to discuss recent developments and future directions. The meeting is an IEEE technically sponsored conference, sponsored by the IEEE Electron Devices Society, and known in the industry as one of the most reputable conferences on semiconductor testing research.

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