/Design, Automation and Test in Europe (DATE) Conference

Design, Automation and Test in Europe (DATE) Conference

March 31 - April 02, 2025 | Lyon, France

Design, Automation and Test in Europe (DATE) Conference is a premier international event covering cutting-edge research and advancements in electronic design automation (EDA), system design, and testing for semiconductor and embedded systems. 

Imec

March 31, 2025

  • Inge Asselberghs, Senior Fund Manager, and Helio Fernandez Tellez, Program Manager, will be participating in the panel of the focus session: "The European Chips Act: Ready to Take-Off" at 2:00 PM
  • Francky Catthoor, senior imec felow, co-authored the paper 'Dynamic Memory Management Optimizations Over Heterogeneous Memory Systems,' which will be presented at 6:30 PM during the session: "PhD Forum."
  • Debjyoti Bhattacharjee, Researcher, will present on 'System Level Performance Evaluation For Superconducting Systems', at 11:15 AM PM during the session: "Emerging design technologies for future computing."

April 1, 2025

  • Vishal Nayar, Senior Venture Development Manager, will present on 'Transistor Aging and Circuit Reliability at Cryogenic Temperatures' at 8:53 AM during the focus session: "3D Integration, Cryogenic Circuits, and Superconducting Logic: Emerging Trends Shaping the Future of High-Performance Computing.
  • Dragomir Milojevic, Senior Scientist at imec & Professor at ULB, is a member of the workshop committee for "Heterogeneous Integration: From Advanced 3D Technology to Innovative Computing Architectures," taking place at 8:30 AM.
  • Kanishkan Vadivel, Researcher imec NL, and Manolis Sifalakis, Principle Researcher imec NL, co-authored the paper 'Multi-partner Project: A Deep Learning Platform Targeting Embedded Hardware For Edge-AI Applications (Neurokit2e),' which will be presented at 11:10 AM during the session: "Driving KDT JU Initiative towards the Chips Act Multi-Partner Projects."
  • Yukai Chen, Researcher, co-authored the paper 'Energy-Aware Error Correction Method For Indoor Positioning And Tracking,' which will be presented at 2:46 PM during the session: "Smart and Autonomous Systems for a Smart World."
  • Francky Catthoor, senior imec felow, Siddharth Rao, Principal Member of Technical Staff, Sebastien Couet, Tommaso Marinelli, R&D Engineer, Anita Farokhnejad, Project Manager, and Gouri Kar, VP R&D, co-authored the paper 'INTERA-ECC: Interconnect-Aware Error Correction In STT-MRAM,' which will be presented at 5:11 PM during the session: "Design, Test, Modeling and Mitigation of defects and faults."

April 2, 2025

  • Giuseppe Fiorentino, Program Manager, will present on 'NanoIC Platform' at 11:20 AM during the focus session: "Empowering European Innovation by Making Leading-Edge Technologies Accessible to Academia.
  • Yukai Chen, Researcher, will present on 'Thermal Feasibility of Backside Integrated LDOs in 2.5D/3D System-in-Package Using Nanosheet Technology', at 4:30 PM during the session: "Late Breaking Results.

Event details

Design, Automation and Test in Europe (DATE) Conference is a premier international event covering cutting-edge research and advancements in electronic design automation (EDA), system design, and testing for semiconductor and embedded systems. It serves as a key platform for academia and industry to discuss innovations in design methodologies, electronic systems, and emerging computing architectures. DATE is organized by leading professional and industry organizations, including the European Design and Automation Association (EDAA), IEEE Council on Electronic Design Automation (CEDA), ACM Special Interest Group on Design Automation (SIGDA), and the Electronic System Design Alliance (ESDA), ensuring a strong connection between academic research and industrial applications.

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